Method of using memory instruction including parameter to affect operating condition of memory

ABSTRACT

Subject matter disclosed herein relates to techniques to use a memory device. A method includes receiving a memory instruction comprising at least one parameter representative of at least one threshold voltage value and a read command to read at least one cell of the memory device. The method further includes detecting at least one voltage value from the at least one cell. The method further includes comparing the at least one voltage value to the at least one threshold voltage value. The method further includes determining at least one logical value of the at least one cell in response to the comparison of the at least one voltage value to the at least one threshold voltage value.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No.12/949,728, filed Nov. 18, 2010 and incorporated in its entirety byreference herein.

BACKGROUND

1. Field

Subject matter disclosed herein relates to techniques to operate memory.

2. Information

Memory devices are employed in many types of electronic devices, such ascomputers, cell phones, PDA's, data loggers, and navigational equipment,just to name a few examples. Among such electronic devices, varioustypes of nonvolatile memory devices may be employed, such as NAND or NORflash memories, SRAM, DRAM, and phase-change memory, just to name a fewexamples. In general, writing or programming operations may be used tostore information in such memory devices, while a read operation may beused to retrieve stored information.

Parameters with which a memory operates may be established by amanufacturer of the memory. For example, such parameters may includecurrent, voltage, and/or resistance reference values for memoryoperations such as read, program, erase, verify, and so on.

BRIEF DESCRIPTION OF THE FIGURES

Non-limiting and non-exhaustive embodiments will be described withreference to the following figures, wherein like reference numeralsrefer to like parts throughout the various figures unless otherwisespecified.

FIG. 1 is a schematic diagram of a memory device, according to anembodiment.

FIG. 2 is a plot showing characteristics of a memory cell andmeasurement parameters, according to an embodiment.

FIG. 3 includes plots showing characteristics of bias signal wave-formsand memory cell voltage or current, according to an embodiment.

FIG. 4 includes plots showing characteristics of bias signal wave-formsand memory cell voltage or current, according to an embodiment.

FIG. 5 is a flow diagram of a process to operate a memory device,according to an embodiment.

FIG. 6 is a schematic diagram illustrating an exemplary embodiment of acomputing system.

DETAILED DESCRIPTION

Reference throughout this specification to “one embodiment” or “anembodiment” means that a particular feature, structure, orcharacteristic described in connection with the embodiment is includedin at least one embodiment of claimed subject matter. Thus, theappearances of the phrase “in one embodiment” or “an embodiment” invarious places throughout this specification are not necessarily allreferring to the same embodiment. Furthermore, the particular features,structures, or characteristics may be combined in one or moreembodiments.

In an embodiment, a technique for operating a memory device may involvea memory instruction directed to the memory device that includes anoperating parameter to affect a physical operating condition of thememory device. In particular, such an operating parameter may affect aphysical operating condition of peripheral circuitry in a memory device.Peripheral circuitry internal to a memory device, for example, maycomprise one or more power sources, sense amplifier circuitry, timingcircuitry (e.g., a clock circuit), row/column decoders, and other suchcircuitry exclusive of an array of memory cells. Inclusion of such anoperating parameter in a memory instruction may provide an opportunityfor a user of the memory device to selectively manage such physicaloperating conditions of the memory device. For example, decreasing amargin between logic levels of a multilevel memory device (e.g.,resulting in increased storage capacity at the expense of decreasedprecision) may be beneficial to a user for one application whileincreasing such a margin (e.g., resulting in increased precision at theexpense of decreased storage capacity) may be beneficial for anotherapplication. In an example, applying a memory instruction READ, whichincludes an address and an operating parameter V_(READ), may result in 1or 0 depending on a threshold voltage being lower or higher thanoperating parameter value V_(READ), respectively. An ability of a userto use other operating parameters may affect reliability and/orperformance of a memory device and/or memory device characteristics suchas write speed, adjustable margin with respect to program/read levels,number of levels stored in any memory cell, data encryption, and so on.A value of such an operating parameter may be selected by a user and/orinstructions executed by a processor, for example. According to acommunication protocol of a memory device, in an embodiment, specificbits of instruction code may be devoted to operating parameterinformation. For example, in a parallel device specific input/outputterminals may receive/send the operating parameter's bits. However, inthe case of a serial device such information may be input/output duringpre-defined clock cycles in an instruction sequence, for example. Amixed serial-parallel protocol may be used in some cases to input aninstruction including an operating parameter at memory pins. In oneimplementation, a physical operating condition used during execution ofa command may assume one among a pre-defined set of possible valuesdepending, at least in part, on corresponding information provided withthe operating parameter. Such a correspondence may be established by alook-up table, for example.

A memory device that may be operated using a memory instruction asdescribed above may comprise volatile or nonvolatile memory includingflash NAND, flash NOR, phase change memory (PCM), single level cell(SLC) memory, multilevel cell (MLC) memory, and so on. In particular, aninstruction directed to a memory device may comprise a number ofelements including a command such as a read command, a write or programcommand, an erase command, and so on. Such elements of an instructionmay also include an address of a location in a memory array of thememory device to where data is to be written or from where data is to beread, for example. Accordingly, an instruction to write to a memoryarray may also comprise such data. In addition to such elements of aninstruction (e.g., a command, address, data, and so on), such aninstruction may additionally include one or more operating parameters tobe used during execution of the instruction and/or subsequentinstructions, as explained in detail below. Such operating parametersmay comprise a voltage reference level of a memory cell in a memoryarray, a margin between or among logic levels of the memory cell, or aramp speed of a bias signal to be applied to the memory cell, just toname a few examples. In one implementation, the memory device mayperform the instruction including interpreting the operating parameter,generating one or more physical quantities that correspond to theoperating parameter, and applying the one or more physical quantities toappropriate nodes/circuits of the memory device.

In one embodiment, such an operating parameter included in a memoryinstruction may be received by a memory device as a digital or analogvalue or as a code to be interpreted by the memory device to determineone or more physical operating conditions and/or operating modes of thememory device. Such a memory device may include a parameter managementblock used to perform a memory instruction by interpreting operatingparameters and affecting operating conditions of peripheral circuitry inthe memory device corresponding to the operating parameters, asdescribed in further detail below.

In one embodiment, an operating parameter included in a memoryinstruction may be used to program memory cells, e.g., modify theprogram cells' threshold voltage, to a level specified by the operatingparameter; this may be achieved by affecting a physical operatingcondition used in a program verification phase to end the programoperation. For example, such an operating parameter may be used to setthe threshold voltage reference value to a desired value correspondingto the input operating parameter. In a similar fashion, an operatingparameter included in a memory read instruction may be used to retrievedata previously stored at a memory address under specific physicaloperating conditions, such as a wordline read voltage, specified by theoperating parameter. Among other advantages, a user may benefit from theoperations described above because, being the only one aware of theprogramming conditions, a user may also be the only one able tocorrectly retrieve the stored data at a later time, as it will beexplained below.

In one embodiment, such an operating parameter included in a memoryinstruction may be useful during a process of bit manipulation. Bitmanipulation may be used if writing data in a page of memory is to beperformed in different steps or stages. In such cases, additional bitsare to be programmed on pages of memory already partly programmed. Forexample, bit manipulation may be used for partial programming, such asduring testing various functions or operations of a computing system,wherein additional programming may be performed at a later time (e.g.,during further testing). In another example, bit manipulation may beused by a user to personalize or customize a memory device. In such acase, data and/or code may be only partially loaded into the memorydevice by the manufacturer at the end of a fabrication process beforeshipment, and the user may subsequently insert additional information(e.g., passwords, code, and so on) to increase security, for example. Inyet another example, bit manipulation may be used in situations wheredata is to be relatively frequently changed (e.g., in a region of memorymaintaining headers or in a File Allocation Table pointing to the memoryand representing an internal organization of the memory). In such acase, bit manipulation may provide an opportunity to avoid erasure ofand/or re-programming an entire block of memory. Of course, such detailsof techniques to operate a memory device using an operating parameterare merely examples, and claimed subject matter is not so limited.

Bit manipulation may or may not involve error correction code (ECC) forintermediate stages of the bit manipulation process. In oneimplementation, ECC may be computed and programmed only after completedata have been stored (e.g., at the end of a bit manipulation process).In such a case, however, a first portion of data may not be ECCprotected, resulting in a risk of error during data read-out atintermediate stages (and consequent mistakes in ECC computation at laterstages of the bit manipulation process). In contrast, if a first portionof data resulting from an early stage of a bit manipulation process isto be ECC protected, additional memory cells may be provided to storeECC during such an early stage of the bit manipulation process. Suchadditional memory cells may be an undesirable additional cost if it isnot possible to write “1” over “0” in memory without erasing a wholeblock of memory, for example. As discussed in detail below, an operatingparameter included in a memory instruction may be useful for bitmanipulation and ECC processes. Of course, such details of bitmanipulation are merely examples, and claimed subject matter is not solimited.

Though embodiments described herein include memory instructionscomprising one or more operating parameters (e.g., operating parameterscomprising input information), operating parameters may also compriseinformation that is a result of an execution of a command (e.g.,operating parameters comprising output information). Such one or moreoperating parameters may also accompany results of an execution of acommand. For example, one or more operating parameters may accompanyread data resulting from execution of a read command. In animplementation, an operating parameter may represent a read voltage atwhich an operation was carried out.

FIG. 1 is a schematic diagram of a memory device 100, according to anembodiment. Such a memory device may be used to perform techniquesdescribed above, for example. In detail, memory device 100 may comprisea memory array 120 to store addressable data, a row decoder 110 andcolumn decoder 130, and a microcontroller 135 including a commandinterface and address/data management block 140 and an operatingparameter management block 150. A port 145 may be used to receiveelements of a memory instruction such as a command, an address of one ormore memory cells in memory array 120, and/or data to be written tomemory array 120, for example. Port 145 may also be used to transmitread data, among a number of other possibilities. In one implementation,port 145 may also be used to receive one or more operating parametersthat may be included with a memory instruction. In anotherimplementation, such operating parameters may be provided to memorydevice 100 at port 155. Either of port 145 or port 155 may comprise aparallel or a serial port. In the case of serial ports, for example,multiple input cycles may be used to provide all or a portion of amemory instruction, including a command, address, data, and/or operatingparameter information. In one implementation, an operation window (e.g.,a time span to perform a write/read/erase operation) of N cycles may beallocated to input N bits of operating parameter information. As anillustrative example, such a window may be placed after eight COMMANDcycles (e.g., for a one-byte command) and before twenty-four ADDRESScycles (e.g., for a three-byte address), though claimed subject matteris not so limited. On the other hand, in the case of parallel ports, forexample, operating parameter information may be input through dedicatedpins in port 155. In one implementation, some data pins in port 145 maybe used to input operating parameter information if a memory instructionincludes a READ command (since such a READ command need not includeinput data). In another implementation, if a memory instruction includesa sector erase command, all address pins may not be necessary.Accordingly, least significant address pins may be available to inputoperating parameter information. In a case of an instruction comprisinga chip erase command to erase the whole memory, no address input nordata input are necessary and all or part of the corresponding pins maybe used to input operating parameter information. Of course, suchdetails of techniques to receive elements of a memory instruction aremerely examples, and claimed subject matter is not so limited.

In an embodiment, upon receiving a memory instruction that includes acommand and operating parameter information, microcontroller 135 mayinterpret the command and use the operating parameter information toexecute the memory instruction. To list a few examples, such anoperating parameter may represent a voltage, such as a wordline (WL)read voltage, a WL program voltage, a WL verification voltage, a voltagedifference, a voltage margin with respect to a pre-defined value (e.g.,as used in a program verify operation), and/or a voltage step during aprogram/erase ramp. However, such an operating parameter may alsorepresent a current value (e.g., for use in flash or floating gatememories) or other physical quantity, such as a resistance value (e.g.,for use in PCM), or a time duration or delay, such as, for example, alapse of time between a bitline pre-charging and a bitline sensing in aNAND memory. In one implementation, such an operating parameter maycomprise a code corresponding to one among a pre-defined set of allowedvalues for a particular quantity (depending on the command to which theoperating parameter refers). For example, one of sixteen possiblevoltage (or current, or resistance, etc.) levels may be chosen accordingto the value of a four-bit parameter code. In another implementation,such an operating parameter may comprise a combination of a code and avalue. For example, during a program operation it may be possible toselect a value for verification voltage (specified by code 1), or formargin (code 2) with respect to a pre-defined verification voltage, or avoltage step amplitude (code 3), or a step duration (code 4) to be usedin a programming voltage ramp. Correspondingly, the code-valuecombination may result in the specified one among the possible physicaloperating conditions being affected by the value of the operatingparameter.

In an embodiment, upon receiving operating parameter information viaport 155, operating parameter management block 150 may internallygenerate a physical quantity corresponding to the operating parameterinformation. For example, in one implementation, operating parametermanagement block 150 may include a voltage (or current) generator togenerate a voltage (or current) with a specified precision thatcorresponds to the operating parameter information. Such a physicalquantity may be applied to relevant circuit portions, such as a wordlinein memory array 120, timing circuitry (not shown), and so on.

TABLE 1 illustrates an example of an instruction set comprising a numberof memory instructions including WRITE ENABLE, READ, PAGE PROGRAM,SECTOR ERASE, and CHIP ERASE. Each such memory instruction may berepresented by an instruction code; it may also include an address,operating parameter(s), and data, as described above. A dummy portion,which may be useful in some applications, may also be included.

TABLE 1 One-byte Instruc- Descrip- instruction Address Parameter DummyData tion tion code bytes bytes bytes bytes WREN Write 06h 0 0 0 0Enable READ Read Data 03h 3 1 0 1 to ∞   Bytes PP Page 02h 3 2 0 1 to256 Program SE Sector D8h 2 1 0 0 Erase CE Chip 60h or 0 3 0 0 Erase C7h

For example, WRITE ENABLE memory instruction may be represented by aone-byte hexadecimal code 06, READ memory instruction by 03, PAGEPROGRAM memory instruction by 02, and SECTOR ERASE memory instruction byD8 and CHIP ERASE memory instruction by 60 or C7. READ memoryinstruction may include a three-byte address and a one-byte operatingparameter code, which may comprise a wordline read voltage, for example.PAGE PROGRAM memory instruction may include a three-byte address and atwo-byte operating parameter code, which may comprise two differentparameters. One parameter may comprise an encryption encoding scheme andthe other parameter may comprise a program verify (WL) voltage, forexample. SECTOR ERASE memory instruction may include a two-byte addressand a one-byte operating parameter code, which may represent a voltagestep (or step duration) in an erase voltage ramp. CHIP ERASE memoryinstruction may include three one-byte operating parameter codes, whichmay represent a reference current level, a wordline read voltage, and/ora well or body read voltage to be used in verifying the memory cellsduring an erase operation of the entire memory, for example. Of course,such details are merely examples, and claimed subject matter is not solimited.

FIG. 2 is a plot showing characteristics of one or more memory cells andmeasurement parameters, according to an embodiment. In particular, astate diagram 200 may be descriptive of a distribution of states in aMLC memory device, for example. A horizontal axis 205 representsrelative voltages associated with memory states while vertical axis 208may represent a relative number of memory cells in an array of the MLCmemory device. Of course, positions and/or scales of such axes aremerely examples, and claimed subject matter is not limited in thisrespect. State diagram 200 shows an erased or reset state 210 andprogrammed or set states 220, 230, 240, 250, 260, and 270, according toan embodiment. Such set states individually begin at threshold voltagevalues α, β, γ, δ, η, φ, respectively. Such memory states of a memorycell may be defined by an amount of voltage placed on a gate of thememory cell during a read operation in specified operating conditions,for example.

In an embodiment, operating parameters included in a memory instructionmay be used to select, for example, one or more threshold voltage valuesof a MLC memory device. As mentioned above, such operating parametersmay be user-selectable. Though such MLC memory devices may have beenmanufactured to have substantially the same electrical and/or operatingcharacteristics as one another, various operating conditions, such asthreshold voltage reference values, may be modified differently fordifferent MLC memory devices, subsequent to such user selection ofoperating parameters. For example, threshold voltage reference values α,β, γ, δ, η, φ may be established in response to a user selectingparticular operating parameters in a memory instruction to program theMLC memory device. As mentioned above, an operating parameter maycomprise a code comprising a set of pre-defined values representing aphysical quantity associated with the parameter. For example, for athree-bit parameter, bits 001 may correspond to 0 volts, 010 maycorrespond to α volts, 011 may correspond to β volts, 100 may correspondto γ volts, 101 may correspond to δ volts, 110 may correspond to ηvolts, and 111 may correspond to φ volts, though claimed subject matteris not so limited. Such an opportunity for a user to select thresholdreference voltage values may lead to customization of the MLC memorydevice for particular application requirements of a user, for example.Also, such an opportunity for a user to select threshold referencevoltage values may include implementation of password protection of datastored in the MLC memory. For example, only a user having knowledge ofthreshold voltage values used to write particular data into the MLCmemory device may subsequently be able to read the particular data(using the threshold voltage reference values used during programoperation). In an implementation, a threshold voltage value V_(T) neednot have a unique logic value associated with it. For example, α<V_(T)<βmay represent a “0” with respect to α, but α<V_(T)<β may represent a “1”with respect to β. In such a case, for example, only the user may knowwith respect to which reference level a read operation should beperformed at any particular address. Accordingly, only the user may beable to retrieve the correct datum (e.g., whether a memory cell at aparticular address was programmed with α<V_(T)<β to mean “0” or “1”). Itmay therefore be possible for the user to define and establish encodingschemes suitable for encryption. For example, the user may freely assignlogical values to threshold voltage ranges measured with respect toparticular reference levels in the bit position in the byte or word. Atread-out the correct parameter code(s) may be input in order to retrievemeaningful data. In a particular implementation, to increase security ofstored data, read data may be considered valid only if such data fallswithin a specified range, which may only be known to a user. Suchranges, for example, may comprise read data between α and δ, between βand φ, or between γ and η. Also, by selecting one or more operatingparameters in a memory instruction, a user may define different logicvalues (e.g., “0” or “1”) in different threshold voltage ranges. Forexample, “1” may be represented by V_(T)<α or γ<V_(T)<δ, and “0” may berepresented by α<V_(T)<γ or δ<V_(T)φ. In one implementation, thresholdvoltage values α, β, γ, δ, η, φ may be stored in the MLC memory deviceto be used as a “key” to read the particular data. Moreover, it is notedthat correspondence between logic values and threshold voltage rangesmay be independently defined for different portions of the memory array,resulting in still further increased flexibility and security. Ofcourse, such details of operating parameters are merely examples, andclaimed subject matter is not so limited.

In an embodiment, a varying amount of information may be stored in amemory array by redefining (e.g., for individual memory cells of thememory array) a number of allowed state levels during a programoperation to write data to the memory array. Subsequently, such data maybe read based on a defined number of allowed state levels. For example,a portion of memory cells in a memory array may comprise two-level (1bit) encoding memory cells, another portion of memory cells may comprisethree-level (1.5 bits) encoding memory cells, yet another portion ofmemory cells may comprise four-level (2 bits) encoding memory cells, andso on. In this case, using FIG. 2 as an exemplifying reference, memorycells in the array may be programmed and read using the operatingparameter β as threshold voltage reference value, if they belong to thefirst one portion (1 bit), with respect to γand η, if they belong to theanother portion (1.5 bit), and using α, δ and φ if they belong to theyet another portion (2 bits/cell). Accordingly, memory capacity of amemory array may be varied dynamically by selecting one or moreoperating parameters (e.g., with a write command) that affect memorycell encoding.

In an embodiment, during a process of bit manipulation, described above,logic content of multi-level memory cells may be defined so as to allowfor overwriting “1” onto “0” in the memory. For example, a user, beingaware of pending steps in a bit manipulation process, may use differentoperating parameters to access (e.g., program or read) multi-levelmemory cells so that different allowed threshold voltage ranges may beassociated with logical values stored therein. Returning to FIG. 2, thefollowing example describes a particular process of bit manipulationinvolving ECC. Such a process of bit manipulation may include twoprogram operations, as in the present example. In a first programoperation, a portion of data may be written to a page (wherein ECC mayprotect a whole page). In the first program operation, a user may select(via one or more operating parameters in a memory instruction) twolowest V_(T) distributions (target distributions) 210 and 220 to storethe data. For example, “1” may be stored using V_(T) distribution 210and “0” may be stored using V_(T) distribution 220 (un-programmed datamay remain in a “1” state). Programming a “0” may be carried out byproviding an instruction that comprises a program command, an address,data, and an operating parameter that represents a wordline programverify level, such as V_(T)=α in FIG. 2. In a similar way, such data maybe read from pages of memory subject to bit manipulation by using aninstruction that comprises a read command, an address, and an operatingparameter that represents a wordline read voltage, such as V_(T)=0 Volts(e.g., to discriminate between “1” and “0” at the first programoperation).

During a second program operation of the bit manipulation process,additional bits may be programmed, which may result in ECC bits beingsubject to change, including otherwise forbidden “0” to “1” transitions.A user may select (via one or more operating parameters in a memoryinstruction) two V_(T) distributions different from the V_(T)distributions used in the first program operation described above. Thus,for example, “1” may be stored using V_(T) distribution 240 and “0” maybe stored using V_(T) distribution 270. Previously programmed data maybe copied from distribution 210 to distribution 240 and fromdistribution 220 to distribution 270, to maintain consistency in theassociation between threshold voltage ranges and logical values.Programming a “0” may be carried out by providing an instruction thatcomprises a program command, an address, data, and a first operatingparameter and a second operating parameter. The first operatingparameter may comprise a wordline program verify level for an “erased”state (e.g., V_(T)=γ in FIG. 2), and the second operating parameter maycomprise a wordline program verify level for a “programmed” state (e.g.,V_(T)=φ). In one implementation, after this stage of the bitmanipulation process, reading data from pages of memory subject to bitmanipulation may be carried out using an instruction comprising a readcommand, an address, and an operating parameter that represents awordline read voltage, such as V_(T)=η Volts (to discriminate between“1” and “0” at this stage with a single access to the memory cell), forexample.

The following example describes a particular process of bit manipulationinvolving ECC, according to an embodiment. Such a process of bitmanipulation may include more than two program operations. In the caseof the following example, a process of bit manipulation includes threeprogram operations. In a first program operation, a portion of data maybe written to a page. In the first program operation, a user may select(via one or more operating parameters in a memory instruction) twolowest V_(T) distributions (target distributions) 210 and 220 to storethe data. For example, “1” may be stored using V_(T) distribution 210and “0” may be stored using V_(T) distribution 220 (un-programmed datamay remain in a “1” state). As explained above, programming a “0” may becarried out by providing an instruction that comprises a programcommand, an address, data, and an operating parameter that represents awordline program verify level, such as V_(T)=α in FIG. 2. In a similarway, such data may be read from pages of memory subject to bitmanipulation by using an instruction that comprises a read command, anaddress, and an operating parameter that represents a wordline readvoltage, such as V_(T)=0 Volts (e.g., to discriminate between “1” and“0” at the first program operation of the bit manipulation process).

During a second program operation of a bit manipulation process, targetV_(T) distributions (e.g., selected by a user via operating parameters)may comprise the V_(T) distribution 220, which may represent a “0” foralready-programmed data that are not changed (e.g., writing “0” onto“0”) and for newly programmed data (e.g., writing “0” onto “1”). Also,another target V_(T) distribution may comprise the V_(T) distribution240, which may represent a “1” for already-programmed data that are notchanged (e.g., writing “1” onto “1”) and for newly programmed data(e.g., writing “1” onto “0”). In such a case, an operating parameterincluded in a memory instruction may represent a program-verify voltagefor “1” (e.g., γ). Also in such a case, in the second program operation,“0” may be associated with a lower threshold voltage than that of “1”.Accordingly, such data may be read from pages of memory subject to bitmanipulation by using an instruction that comprises a read command, anaddress, and an operating parameter that represents a wordline readvoltage, such as V_(T)=γ, for example.

During a third program operation of a bit manipulation process, targetV_(T) distributions (e.g., selected by a user via operating parameters)may comprise the V_(T) distribution 240, which may represent a “1” foralready-programmed data that are not changed (e.g., writing “1” onto“1”) and for newly programmed data (e.g., writing “1” onto “0”). Also,another target V_(T) distribution may comprise the V_(T) distribution270, which may represent a “0” for already-programmed data that are notchanged (e.g., writing “0” onto “0”) and for newly programmed data(e.g., writing “0” onto “1”). In such a case, an operating parameterincluded in a memory instruction may represent a program-verify voltagefor “0” (e.g., φ). Also in such a case, in the third program operation,“1” may be associated with a lower threshold voltage than that of “0”.Accordingly, such data may be read from pages of memory subject to bitmanipulation by using an instruction that comprises a read command, anaddress, and an operating parameter that represents a wordline readvoltage, such as V_(T)=φ (or V_(T)=η, to increase the read margin withrespect to programmed cells in V_(T) distribution 270), for example. Ofcourse, such details of bit manipulation are merely examples, andclaimed subject matter is not so limited.

FIG. 3 includes plots showing characteristics 300 of bias signalwave-forms and memory cell voltage or current, according to anembodiment. Such bias signal wave-forms may be applied to a gate of amemory cell, for example, to be used to program a state of the memorycell (possible variations for end of program verification betweensubsequent steps may not be represented in the wave-form diagram). Biassignal wave-form 310 includes a relatively large voltage step V_(step)and relatively short time step T_(step). In contrast, bias signalwave-form 330 includes a relatively small voltage step V_(step) andrelatively long time step T_(step). Bias signal wave-form 320 includes avoltage step V_(step) and a time step T_(step) that are between valuesfor bias signal wave-form 310 and bias signal wave-form 330. Values ofvoltage step V_(step) and time step T_(step) may affect precision and/orspeed of a memory operation. Though claimed subject matter is not solimited, increasing precision may result in decreased speed of a memoryoperation, whereas decreasing precision may result in increased speed ofa memory operation. In an implementation, values for voltage stepV_(step) and a time step T_(step) (and thus precision and/or speed) maybe selected by one or more values and/or codes of an operating parameterincluded in a memory instruction, as discussed above. Accordingly,performance of a memory device may be selected by a user who may prefera memory operation to be relatively fast rather than precise, or to berelatively slow and highly precise (e.g., relatively many levels ofstates of a single memory cell may be preferred at the cost of longerexecution time). Of course, such details of bias waveforms are merelyexamples, and claimed subject matter is not so limited.

In one implementation, one portion of a memory array may be affected byone or more operating parameters differently than another portion of thememory array. In other words, operating parameters need not affect allportions of a memory array in the same fashion. Thus, for example,different blocks, pages, words, or bytes may have different encodingbased, at least in part, on one or more operating parameters included ina memory instruction, as described above.

In an embodiment, a process to write information to a PCM cell maycomprise setting or resetting the PCM cell to one state or another. Forexample, a PCM cell may be reset by melting phase change material byapplying a relatively high amplitude, relatively short durationelectrical programming pulse. In contrast, a PCM cell may be set byapplying a relatively smaller sub-melt amplitude electrical programmingpulse having a relatively longer duration, which may include arelatively abrupt drop, for example. A PCM cell may also be set byapplying a higher over-melt amplitude electrical programming pulse,possibly having a gradual, sloping drop in voltage or current over time,to allow molten phase change material to crystallize. Such a resetand/or set pulse and process may be applied as a “write” or “program”pulse and a “write” or “program” process. In an implementation, one ormore operating parameters may accompany a write command in a memoryinstruction, as described above. Values of such operating parameters mayaffect various elements of a programming pulse, such as magnitude,duration, slope, and so on. Of course, such details of a programmingpulse are merely examples, and claimed subject matter is not so limited.

FIG. 4 includes plots showing characteristics of bias signal wave-formsand memory cell voltage or current, according to an embodiment. Suchbias signal wave-forms may be applied to PCM cells during a process ofreading the PCM cells (e.g., such as during a write-verify process). Asexplained below, particular characteristics of such bias signalwave-forms may be selected using an operating parameter included in amemory instruction. For example, a memory instruction may comprise awrite command, an address of a memory array, data to be written, and oneor more operating parameters to affect one or more particularcharacteristics of bias signal wave-forms to be used to write the datato the memory array. Such particular characteristics of bias signalwave-forms may include pulse amplitude, pulse slope, pulse step width,pulse step height, and so on. Further, an operating parameter may beused to select among a number of types of bias signal wave-form, such asbias signal wave-forms 410 and 420. For example, bias signal wave-form410 may include a series of set pulses 412, 414, and 416 comprising awaveform having individual peak amplitudes that sequentially increasefrom one pulse to the next. Such a bias signal wave-form may address anissue of variability of physical and/or electrical characteristics of aplurality of PCM cells in a PCM or in multiple PCM devices. In oneparticular implementation, first bias pulse 412 may comprise anegative-slope set ramp 435 extending from peak amplitude 440 to a rampterminus 430. Though set pulse 412 is shown to have a linear set rampand vertical transitions, plot 400 is only intended to represent aschematic view of bias signal, and claimed subject matter is not limitedin this respect. In one particular implementation, peak amplitude 450 ofsecond set pulse 414 may be greater than peak amplitude 440 of theprevious, first set pulse 412. As another example, bias signal wave-form420 includes a series of reset pulses 422, 424, and 426 comprises awaveform having individual amplitudes that sequentially increase fromone pulse to the next, for example. In contrast to bias signal wave-form410, bias signal wave-form 420 need not include a negative-slope setramp. Of course, such details of techniques to operate a PCM are merelyexamples, and claimed subject matter is not so limited.

FIG. 5 is a flow diagram of a process 500 to operate a memory device,according to an embodiment. As discussed above, a technique foroperating a memory device may involve a memory instruction directed tothe memory device that includes an operating parameter to affect aphysical operating condition of the memory device. At block 510, thememory device may receive such a memory instruction that includes acommand to operate at a memory location. At block 520, in addition toincluding a command and possibly an address descriptive of the memorylocation, the memory device may receive the memory instruction includingan operating parameter. For example, a memory instruction may include aREAD command, an address, and an operating parameter V_(READ), which maybe used to select a reference threshold voltage for memory cellsspecified by the address. In a particular implementation, such anoperating parameter need not comprise a value of a voltage, for example,but instead may comprise a code that represent values of a voltage (orcurrent, or time, and so on). In one case, the memory device may store atable of values used to convert a code of an operating parameter to anactual voltage or current. Such a table may be created and/or modifiedby writing to the table (maintained in a portion of the memory device),for example. Such a conversion of (digital) code to an actual (analog)voltage or current may be performed by a digital-to-analog-convertor(DAC) and/or a voltage or current generator, which may be included inthe memory device. As mentioned above, the memory device may receivesuch an operating parameter serially or in parallel with the command andmemory address. At block 530, while performing the memory instructionreceived at block 510, one or more physical operating conditions (e.g.,threshold voltage of memory cells) of the memory device may be modifiedbased, at least in part, on the operating parameter. Of course, suchdetails of process 500 are merely examples, and claimed subject matteris not so limited.

FIG. 6 is a schematic diagram illustrating an exemplary embodiment of acomputing system 600 including a memory device 610. Such a computingdevice may comprise one or more processors, for example, to execute anapplication and/or other code. For example, memory device 610 maycomprise a memory that includes a portion of PCM 100, shown in FIG. 1. Acomputing device 604 may be representative of any device, appliance, ormachine that may be configurable to manage memory device 610. Memorydevice 610 may include a memory controller 615 and a memory 622. In oneimplementation, memory controller 615 may include a parameter managementblock 650 to receive an operating parameter included in a memoryinstruction, and to modify physical operating conditions of memorydevice 610 based, at least in part, on the operating parameter. By wayof example but not limitation, computing device 604 may include: one ormore computing devices and/or platforms, such as, e.g., a desktopcomputer, a laptop computer, a workstation, a server device, or thelike; one or more personal computing or communication devices orappliances, such as, e.g., a personal digital assistant, mobilecommunication device, or the like; a computing system and/or associatedservice provider capability, such as, e.g., a database or data storageservice provider/system; and/or any combination thereof.

It is recognized that all or part of the various devices shown in system600, and the processes and methods as further described herein, may beimplemented using or otherwise including hardware, firmware, software,or any combination thereof. Thus, by way of example but not limitation,computing device 604 may include at least one processing unit 620 thatis operatively coupled to memory 622 through a bus 640 and a host ormemory controller 615. Processing unit 620 is representative of one ormore circuits configurable to perform at least a portion of a datacomputing procedure or process. By way of example but not limitation,processing unit 620 may include one or more processors, controllers,microprocessors, microcontrollers, application specific integratedcircuits, digital signal processors, programmable logic devices, fieldprogrammable gate arrays, and the like, or any combination thereof.Processing unit 620 may include an operating system configured tocommunicate with memory controller 615. Such an operating system may,for example, generate memory instructions including commands, addresses,and/or operating parameters to be sent to memory controller 615 over bus640. Such commands may comprise read, write, or erase commands. Inresponse to such memory instructions, for example, memory controller 615may perform process 500 described above, to perform the command and/ormodify one or more physical operating conditions of memory device 610.For example, memory controller 615 may increase a magnitude of a biassignal applied to at least one of an array of PCM cells in response toan operating parameter included in a memory instruction.

Memory 622 is representative of any data storage mechanism. Memory 622may include, for example, a primary memory 624 and/or a secondary memory626. Primary memory 624 may include, for example, a random accessmemory, read only memory, etc. While illustrated in this example asbeing separate from processing unit 620, it should be understood thatall or part of primary memory 624 may be provided within or otherwiseco-located/coupled with processing unit 620.

Secondary memory 626 may include, for example, the same or similar typeof memory as primary memory and/or one or more data storage devices orsystems, such as, for example, a disk drive, an optical disc drive, atape drive, a solid state memory drive, etc. In certain implementations,secondary memory 626 may be operatively receptive of, or otherwiseconfigurable to couple to, a computer-readable medium 628.Computer-readable medium 628 may include, for example, any medium thatcan carry and/or make accessible data, code, and/or instructions for oneor more of the devices in system 600.

Computing device 604 may include, for example, an input/output 632.Input/output 632 is representative of one or more devices or featuresthat may be configurable to accept or otherwise introduce human and/ormachine inputs, and/or one or more devices or features that may beconfigurable to deliver or otherwise provide for human and/or machineoutputs. By way of example but not limitation, input/output device 632may include an operatively configured display, speaker, keyboard, mouse,trackball, touch screen, data port, etc.

The terms, “and,” “and/or,” and “or” as used herein may include avariety of meanings that will depend at least in part upon the contextin which it is used. Typically, “and/or” as well as “or” if used toassociate a list, such as A, B or C, is intended to mean A, B, and C,here used in the inclusive sense, as well as A, B or C, here used in theexclusive sense. Reference throughout this specification to “oneembodiment” or “an embodiment” means that a particular feature,structure, or characteristic described in connection with the embodimentis included in at least one embodiment of claimed subject matter. Thus,the appearances of the phrase “in one embodiment” or “an embodiment” invarious places throughout this specification are not necessarily allreferring to the same embodiment. Furthermore, the particular features,structures, or characteristics may be combined in one or moreembodiments.

While there has been illustrated and described what are presentlyconsidered to be example embodiments, it will be understood by thoseskilled in the art that various other modifications may be made, andequivalents may be substituted, without departing from claimed subjectmatter. Additionally, many modifications may be made to adapt aparticular situation to the teachings of claimed subject matter withoutdeparting from the central concept described herein. Therefore, it isintended that claimed subject matter not be limited to the particularembodiments disclosed, but that such claimed subject matter may alsoinclude all embodiments falling within the scope of the appended claims,and equivalents thereof.

What is claimed is:
 1. A method of using a memory device, the methodcomprising: receiving a memory instruction comprising at least oneparameter representative of at least one threshold voltage value and aread command to read at least one cell of the memory device; detectingat least one voltage value from the at least one cell; comparing the atleast one voltage value to the at least one threshold voltage value; anddetermining at least one logical value of the at least one cell inresponse to the comparison of the at least one voltage value to the atleast one threshold voltage value.
 2. The method of claim 1, furthercomprising controlling access by a user to data stored by memory deviceby determining whether the user is authorized to access the data.
 3. Themethod of claim 2, wherein determining whether the user is authorized toaccess the data comprises receiving a password from the user.
 4. Themethod of claim 1, wherein the at least one threshold voltage value waspreviously used during a program operation to program the at least onevoltage value of the at least one cell.
 5. The method of claim 1,wherein the at least one cell comprises a first set of cells and asecond set of cells, wherein determining the at least one logical valuecomprises: comparing voltage values of the first set of cells to a firstthreshold voltage value; and comparing voltage values of the second setof cells to a second threshold voltage value, the second thresholdvoltage value different from the first threshold voltage value.
 6. Themethod of claim 5, wherein the first set of cells is in a first bitposition in a byte or word and the second set of cells is in a secondbit position in the byte or word, wherein the second bit position isdifferent from the first bit position.
 7. The method of claim 1, furthercomprising determining whether the at least one voltage value is validin response to the comparison of the at least one voltage value to atleast one threshold voltage value.
 8. The method of claim 1, furthercomprising assigning logical values to corresponding ranges of voltagevalues delimited by one or more of the at least one threshold voltagevalues.
 9. The method of claim 8, wherein at least one logical value isassigned to two or more corresponding, non-contiguous ranges of voltagevalues.
 10. The method of claim 8, wherein said assigning logical valuesto corresponding ranges of voltage values comprises defining a firstcorrespondence for a first portion of the memory device and defining asecond correspondence for a second portion of the memory device, thefirst correspondence different from the second correspondence and thefirst portion different from the second portion.
 11. The method of claim1, wherein the at least one threshold voltage value is stored in thememory device.
 12. The method of claim 1, wherein the memory device is amulti-level cell memory device.
 13. The method of claim 1, whereinlogical values are dynamically assigned to threshold voltage rangesmeasured with respect to the at least one threshold voltage value. 14.The method of claim 1, wherein correspondence between logical values andthreshold voltage ranges is independently defined for different portionsof the memory array.
 15. The method of claim 1, wherein the at least oneparameter is coded.
 16. The method of claim 1, wherein the at least oneparameter is transmitted on specific input/output terminals.
 17. Themethod of claim 1, wherein the at least one parameter is transmittedduring pre-defined clock cycles in an instruction sequence.
 18. Themethod of claim 1, wherein the at least one parameter is representativeof the at least one threshold voltage value based at least in part oncorresponding information provided by a look-up table.
 19. The method ofclaim 1, wherein the at least one parameter comprises a first parameterrepresentative of a first threshold voltage value and a second parameterrepresentative of a second threshold voltage value, wherein the firstparameter is used in a read command after a first programming operationand the second parameter is used in a read command after a secondprogramming operation.
 20. The method of claim 19, wherein the secondthreshold voltage value is higher than the first threshold voltagevalue.
 21. The method of claim 20, wherein the at least one cellcomprises at least one error-correction-code cell.
 22. The method ofclaim 19, further comprising: programming data in a plurality of cellsof the memory device in the first programming operation using the firstthreshold voltage value; and re-programming at least a portion of thedata in the plurality of cells in the second programming operation usingthe second threshold voltage value, wherein, in the first programmingoperation, a first threshold voltage distribution corresponding to afirst logic value is lower than a second threshold voltage distributioncorresponding to a second logic value, and in the second programmingoperation, a third threshold voltage distribution corresponding to thefirst logic value is higher than the second threshold voltagedistribution.
 23. A method of accessing of a memory device, the methodcomprising: programming data in a plurality of cells of the memorydevice in a first programming operation, the first programming operationusing a first memory instruction comprising at least one first parameterrepresentative of at least one first threshold voltage value for saidprogramming; and re-programming at least a portion of the data in theplurality of cells in a second programming operation, the secondprogramming operation using a second memory instruction comprising atleast one second parameter representative of at least one secondthreshold voltage value for said re-programming, wherein saidre-programming provides bit manipulation of the portion of the data. 24.The method of claim 23, wherein the first programming operationcomprises selecting a first set of threshold voltage distributions toprogram the data.
 25. The method of claim 24, wherein the secondprogramming operation comprises selecting a second set of thresholdvoltage distributions to re-program the data.
 26. The method of claim23, wherein the second programming operation comprises programmingadditional bits.
 27. The method of claim 23, further comprisingre-programming at least a second portion of the data in the plurality ofcells in a third programming operation, the third programming operationusing a third memory instruction comprising at least one third parameterrepresentative of at least one third threshold voltage value for saidre-programming.